Why ACM Systems Depend on Precise Field Measurements

Vehicle incidents of a minor nature may not have obvious signs that a claim or lawsuit is imminent. Often, by the time an insurance company receives notice that a potential claim exists, the valuable evidence from the incident may no longer exist. Additionally, an attorney may have a client that seeks representation, but the incident data may not be at hand to properly evaluate the legitimacy of the claim. In response, Nederveld has developed Low Velocity Impact (LVI) Centers to provide Vehicle Event Evaluations, a high-quality examination documentation product at an affordable price. Our solution preserves evidence and valuable collision-related data for incidents of a minor to more severe (drive-away) nature. Using a combination of EDR (Event Data Recorder) system data, and their 360°-photographic method, Nederveld provides a comprehensive CDR (Crash Data Retrieval) Report along with photographic documentation via email within 48 hours of completing the service.
Accurate, Fabrication-Ready Measurement Data
Our Reality Capture workflow produces unified, model-ready data that integrates directly into panel fabrication.
Our Reality Capture workflow produces unified, model-ready data that integrates directly into panel fabrication. By combining cutting-edge technology with integrity-driven service, we deliver results that consistently exceed expectations.

What is this service?
- Typical field tolerance: ±2mm over large facade areas
- Leica RTC360 and P-Series high-accuracy LiDAR
- Processing aligned with ASTM E57 and USIBD LOA20–30 standards
Where Reality Capture Adds Value
Collaboration and accountability create the foundation for exceptional outcomes—that’s what we bring to every project. Our laser scanning services support ACM panel projects at every stage, reducing risk, improving alignment, and ensuring panels are fabricated to verified field conditions.
Our Promise
- Intentional Communication
- Reliable Service
- Justifiable Conclusions
Your Praise
History

